Ming Ting Wu

9 Patents

• US121967812025

  Probes with Planar Unbiased Spring Elements for Electronic Component Contact, Methods for Making Such Probes, and Methods for Using Such Probes

  Microfabrica Inc.

  0 cites
• US121967822025

  Probes with Planar Unbiased Spring Elements for Electronic Component Contact, Methods for Making Such Probes, and Methods for Using Such Probes

  Microfabrica Inc.

  0 cites
• US121814932024

  Compliant Probes Including Dual Independently Operable Probe Contact Elements Including at Least One Flat Extension Spring, Methods for Making, and Methods for Using

  Microfabrica Inc.

  0 cites
• US120786572024

  Compliant Pin Probes with Extension Springs, Methods for Making, and Methods for Using

  Microfabrica Inc.

  0 cites
• US119065492024

  Compliant Pin Probes with Flat Extension Springs, Methods for Making, and Methods for Using

  Microfabrica Inc.

  0 cites
• US118677212024

  Probes with Multiple Springs, Methods for Making, and Methods for Using

  Microfabrica Inc.

  0 cites
• US118028912023

  Compliant Pin Probes with Multiple Spring Segments and Compression Spring Deflection Stabilization Structures, Methods for Making, and Methods for Using

  Microfabrica Inc.

  0 cites
• US117682272023

  Multi-layer Probes Having Longitudinal Axes and Preferential Probe Bending Axes That Lie in Planes That Are Nominally Parallel to Planes of Probe Layers

  MICROFABRICA Inc.

  0 cites
• US116301272023

  Multi-layer, Multi-material Micro-scale and Millimeter-scale Devices with Enhanced Electrical And/or Mechanical Properties

  University Of Southern California

  0 cites