Min-kun Dai

8 Patents

• US124329712025

  Transistor Including a Hydrogen-diffusion Barrier and Methods for Forming the Same

  Taiwan Semiconductor Manufacturing Company Limited

  0 cites
• US122740682025

  Method of Forming Ferroelectric Memory Device

  Taiwan Semiconductor Manufacturing Company, Ltd.

  0 cites
• US122455152025

  Interconnection for a Memory Array and Methods for Forming the Same

  TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.

  0 cites
• US121676092024

  Semiconductor Structure and Method of Forming the Same

  TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.

  0 cites
• US120786072024

  Wide-bandgap Semiconductor Layer Characterization

  Taiwan Semiconductor Manufacturing Company Limited

  0 cites
• US119359352024

  Transistor Including a Hydrogen-diffusion Barrier and Methods for Forming the Same

  Taiwan Semiconductor Manufacturing Company Limited

  0 cites
• US118568542023

  MRAM Device Structures and Method of Fabricating the Same

  TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.

  0 cites
• US118376672023

  Transistors with Enhanced Dopant Profile and Methods for Forming the Same

  Taiwan Semiconductor Manufacturing Company Limited

  0 cites