Min-cheol Kang

7 Patents

• US124691952025

  Electronic Device Supporting Manufacture of Semiconductor Device and Operating Method of Electronic Device

  Samsung Electronics Co., Ltd.

  0 cites
• US123615372025

  Electronic Device Including Processor Executing Defect Detection Module, Operating Method of Electronic Device, and Method for Fabricating Semiconductor Integrated Circuit

  SAMSUNG ELECTRONICS CO., Ltd.

  0 cites
• US123549202025

  Method of Forming Optical Proximity Correction Model and Method of Fabricating Semiconductor Device Using the Same

  Samsung Electronics Co., Ltd.

  0 cites
• US122546212025

  Method, Electronic Device and Operating Method of Electronic Device and Manufacture of Semiconductor Device

  Seoul National University R&DB Foundation

  0 cites
• US121187082024

  Device and Method for Detecting Defects on Wafer

  SEOUL NATIONAL UNIVERSITY R&DB FOUNDATION

  0 cites
• US120621642024

  Pattern Analysis System and Method of Manufacturing Semiconductor Device Using the Same

  SAMSUNG ELECTRONICS CO., Ltd.

  0 cites
• US117143472023

  Process Proximity Correction Method and the Computing Device for the Same

  SAMSUNG ELECTRONICS CO., Ltd.

  0 cites