Patents/Inventors

Mill-jer Wang

HsinchuTW13 patents

15 Patents

US125718322026
Inspection Apparatus and Method
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites
US123227422025
Semiconductor Structure and Manufacturing Method Thereof
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.
0 cites
US121051312024
Antenna Testing Device for High Frequency Antennas
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites
US120625862024
Semiconductor Device Structure with Magnetic Element
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites
US120190972024
Method for Forming Probe Head Structure
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites
US119065732024
Testing Module and Testing Method Using the Same
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites
US118526722023
Test Circuit and Method
TAIWAN SEMICONDUCTORMANUFACTURING COMPANY LIMITED
0 cites
US118550662023
Semiconductor Structure and Manufacturing Method Thereof
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.
0 cites
US117261122023
Electromagnetic Shielding During Wafer Stage Testing
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites
US117261222023
Antenna Testing Device and Method for High Frequency Antennas
TAIWAN SEMICONDUCTOR MANUFACTURING CO., Ltd.
0 cites
US116930452023
Testing Module and Testing Method Using the Same
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites
US116316212023
Semiconductor Device Structure with Magnetic Element
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites
US115858312023
Test Probing Structure
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites
US115858462023
Testing Module and Testing Method Using the Same
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites
US115791902023
Testing Holders for Chip Unit and Die Package
TAIWAN SEMICONDUCTOR MANUFACTURING CO., Ltd.
0 cites