Miguel Bautista Gabriel

3 Patents

• US123077472025

  In-situ Detection of Anomalies in Integrated Circuits Using Machine Learning Models

  Intel Corporation

  0 cites
• US122378322025

  Circuits and Methods for Supply Voltage Detection and Timing Monitoring

  Intel Corporation

  0 cites
• US118287762023

  Circuits and Methods for Voltage Detection in Integrated Circuits

  Intel Corporation

  0 cites