Patents/Inventors

Michael Sheperek

Longmont, COUS48 patents

55 Patents

US124825302025
Tracking and Refreshing State Metrics in Memory Sub-systems
Micron Technology, Inc.
0 cites
US124230132025
Open Block Family Duration Limited by Temperature Variation
Micron Technology, Inc.
0 cites
US124242882025
Adjustment of Program Verify Targets Corresponding to a Last Programming Distribution and a Programming Distribution Adjacent to an Initial Programming Distribution
Micron Technology, Inc.
0 cites
US124171582025
Closing Block Family Based on Soft and Hard Closure Criteria
Micron Technology, Inc.
0 cites
US123341662025
Data Integrity Checks Based on Voltage Distribution Metrics
Micron Technology, Inc.
0 cites
US123071112025
Block Family-based Error Avoidance for Memory Devices
Micron Technology, Inc.
0 cites
US122930992025
Open Block Family Duration Limited by Time and Temperature
Micron Technology, Inc.
0 cites
US121255392024
Adjustment of a Starting Voltage Corresponding to a Program Operation in a Memory Sub-system
Micron Technology, Inc.
0 cites
US120400262024
Adjustment of Program Verify Targets Corresponding to a Last Programming Distribution and a Programming Distribution Adjacent to an Initial Programming Distribution
Micron Technology, Inc.
0 cites
US119830652024
Logic Based Read Sample Offset in a Memory Sub-system
Micron Technology, Inc.
0 cites
US119551942024
Tracking and Refreshing State Metrics in Memory Sub-systems
Micron Technology, Inc.
0 cites
US119408922024
Closing Block Family Based on Soft and Hard Closure Criteria
Micron Technology, Inc.
0 cites
US119412772024
Combination Scan Management for Block Families of a Memory Device
Micron Technology, Inc.
0 cites
US119157762024
Error Avoidance Based on Voltage Distribution Parameters of Block Families
Micron Technology, Inc.
0 cites
US119085362024
First-pass Continuous Read Level Calibration
Micron Technology, Inc.
0 cites
US118867262024
Block Family-based Error Avoidance for Memory Devices
Micron Technology, Inc.
0 cites
US118622742024
Determination of State Metrics of Memory Sub-systems Following Power Events
Micron Technology, Inc.
0 cites
US118535562023
Combining Sets of Memory Blocks in a Memory Device
Micron Technology, Inc.
0 cites
US118420612023
Open Block Family Duration Limited by Temperature Variation
Micron Technology, Inc.
0 cites
US118427722023
Voltage Bin Boundary Calibration at Memory Device Power Up
Micron Technology, Inc.
0 cites
US118372912023
Voltage Offset Bin Selection by Die Group for Memory Devices
Micron Technology, Inc.
0 cites
US118171522023
Generating Embedded Data in Memory Cells in a Memory Sub-system
Micron Technology, Inc.
0 cites
US118106312023
Data Integrity Checks Based on Voltage Distribution Metrics
Micron Technology, Inc.
0 cites
US117896402023
Estimation of Read Level Thresholds Using a Data Structure
Micron Technology, Inc.
0 cites
US117910042023
Threshold Voltage Offset Bin Selection Based on Die Family in Memory Devices
Micron Technology, Inc.
0 cites
US117686192023
Voltage Based Combining of Block Families for Memory Devices
Micron Technology, Inc.
0 cites
US117554782023
Block Family Combination and Voltage Bin Selection
Micron Technology, Inc.
0 cites
US117420272023
Dynamic Program Erase Targeting with Bit Error Rate
Micron Technology, Inc.
0 cites
US117338962023
Reliability Scan Assisted Voltage Bin Selection
Micron Technology, Inc.
0 cites
US117339282023
Read Sample Offset Bit Determination in a Memory Sub-system
Micron Technology, Inc.
0 cites
US117339292023
Memory System with Dynamic Calibration Using a Variable Adjustment Mechanism
Micron Technology, Inc.
0 cites
US117352542023
Error Avoidance Based on Voltage Distribution Parameters of Blocks
Micron Technology, Inc.
0 cites
US117266892023
Time-based Combining for Block Families of a Memory Device
Micron Technology, Inc.
0 cites
US117279942023
Performing Threshold Voltage Offset Bin Selection by Package for Memory Devices
Micron Technology, Inc.
0 cites
US117213992023
Memory System with Dynamic Calibration Using a Trim Management Mechanism
Micron Technology, Inc.
0 cites
US117214092023
Smart Sampling for Block Family Scan
Micron Technology, Inc.
0 cites
US117145802023
Dynamic Background Scan Optimization in a Memory Sub-system
Micron Technology, Inc.
0 cites
US117147102023
Providing Data of a Memory System Based on an Adjustable Error Rate
Micron Technology, Inc.
0 cites
US117097752023
Write Data for Bin Resynchronization After Power Loss
Micron Technology, Inc.
0 cites
US117042172023
Charge Loss Scan Operation Management in Memory Devices
Micron Technology, Inc.
0 cites
US117051922023
Managing Read Level Voltage Offsets for Low Threshold Voltage Offset Bin Placements
Micron Technology, Inc.
0 cites
US117051932023
Error Avoidance Based on Voltage Distribution Parameters
Micron Technology, Inc.
0 cites
US117052082023
Read Level Calibration in Memory Devices Using Embedded Servo Cells
Micron Technology, Inc.
0 cites
US116755092023
Multiple Open Block Families Supporting Multiple Cursors of a Memory Device
Micron Technology, Inc.
0 cites
US116755112023
Associating Multiple Cursors with Block Family of Memory Device
Micron Technology, Inc.
0 cites
US116693802023
Dynamic Programming of Page Margins
Micron Technology, Inc.
0 cites
US116640802023
Bin Placement According to Program-erase Cycles
Micron Technology, Inc.
0 cites
US116518282023
First-pass Dynamic Program Targeting (DPT)
Micron Technology, Inc.
0 cites
US116369132023
Tracking and Refreshing State Metrics in Memory Sub-systems
Micron Technology, Inc.
0 cites
US116251772023
Combination Scan Management for Block Families of a Memory Device
Micron Technology, Inc.
0 cites
US116097062023
Read Sample Offset Placement
Micron Technology, Inc.
0 cites
US116003332023
Adjustment of a Voltage Corresponding to a Programming Distribution Based on a Program Targeting Rule
Micron Technology, Inc.
0 cites
US116003542023
Determination of State Metrics of Memory Sub-systems Following Power Events
Micron Technology, Inc.
0 cites
US115737202023
Open Block Family Duration Limited by Time and Temperature
Micron Technology, Inc.
0 cites
US115452272023
Threshold Voltage Offset Bin Selection Based on Die Family in Memory Devices
MICRON TECHNOLOGY, Inc.
0 cites