2 Patents
- US120387202024Arrangement and Method for Detecting a Measured Value on the Basis of Electron Holography
Technische Universität Berlin
0 cites - US115435052023Optoelectronic Modules Operable to Recognize Spurious Reflections and to Compensate for Errors Caused by Spurious Reflections
AMS SENSORS SINGAPORE PTE. Ltd.
0 cites