Patents/Inventors

Michael Kutney

Santa Clara, CAUS14 patents

14 Patents

US124051642025
Spatial Optical Emission Spectroscopy for Etch Uniformity
Applied Materials, Inc.
0 cites
US123396452025
Estimation of Chamber Component Conditions Using Substrate Measurements
Applied Materials, Inc.
0 cites
US122835032025
Substrate Measurement Subsystem
Applied Materials, Inc.
0 cites
US122164552025
Chamber Component Condition Estimation Using Substrate Measurements
Applied Materials, Inc.
0 cites
US121911762025
Integrated Substrate Measurement System to Improve Manufacturing Process Performance
Applied Materials, Inc.
0 cites
US121486472024
Integrated Substrate Measurement System
Applied Materials, Inc.
0 cites
US121365572024
Integrated Substrate Measurement System to Improve Manufacturing Process Performance
Applied Materials, Inc.
0 cites
US120666392024
Adjustable Achromatic Collimator Assembly for Endpoint Detection Systems
Applied Materials, Inc.
0 cites
US119275432024
Multiple Reflectometry for Measuring Etch Parameters
Applied Materials, Inc.
0 cites
US117199522023
Adjustable Achromatic Collimator Assembly for Endpoint Detection Systems
Applied Materials, Inc.
0 cites
US116886162023
Integrated Substrate Measurement System to Improve Manufacturing Process Performance
Applied Materials, Inc.
0 cites
US116686022023
Spatial Optical Emission Spectroscopy for Etch Uniformity
Applied Materials, Inc.
0 cites
US116195942023
Multiple Reflectometry for Measuring Etch Parameters
Applied Materials, Inc.
0 cites
USD09775042023
Portion of a Display Panel with a Graphical User Interface
Applied Materials, Inc.
0 cites