Patents/Inventors

Michael Durr

Mountain View, CAUS4 patents

4 Patents

US125305152026
Maximizing Detectable Defect Coverage of Analog Circuits in Integrated Circuit Design
Synopsys, Inc.
0 cites
US122716682025
Finding Equivalent Classes of Hard Defects in Stacked MOSFET Arrays
Synopsys, Inc.
0 cites
US117977372023
Finding Equivalent Classes of Hard Defects in Stacked MOSFET Arrays
Synopsys, Inc.
0 cites
US117630562023
Method and System for Custom Model Definition of Analog Defects in an Integrated Circuit
Synopsys, Inc.
0 cites