Patents/Inventors

Miao-pei Chen

HsinchuTW2 patents

3 Patents

US120446312024
Wafer Surface Defect Inspection Method and Apparatus Thereof
Globalwafers Co., Ltd.
0 cites
US119713652024
Wafer Processing System and Rework Method Thereof
Globalwafers Co., Ltd.
0 cites
US118524652023
Wafer Inspection Method and Apparatus Thereof
Globalwafers Co., Ltd.
0 cites