Patents/Inventors

Meng-jung Lee

HsinchuTW4 patents

4 Patents

US125355362026
Method for Testing Power Leakage of Circuit and Processing System Using Same
REALTEK SEMICONDUCTOR Corp.
0 cites
US123745882025
Method for Evaluating Non-uniform Stress
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites
US119599562024
Circuit Check Method and Electronic Apparatus
REALTEK SEMICONDUCTOR Corp.
0 cites
US118044102023
Thin-film Non-uniform Stress Evaluation
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites