Meng-feng Tsai

3 Patents

• US126222302026

  Test Structure and Method for Forming the Same, and Semiconductor Memory

  CHANGXIN MEMORY TECHNOLOGIES, Inc.

  0 cites
• US122180162025

  Semiconductor Structure

  CHANGXIN MEMORY TECHNOLOGIES, Inc.

  0 cites
• US119617742024

  Semiconductor Device and Method for Manufacturing Same

  CHANGXIN MEMORY TECHNOLOGIES, Inc.

  0 cites