Meng-chun Shih

9 Patents

• US122100552025

  Semiconductor Wafer Testing System and Related Method for Improving External Magnetic Field Wafer Testing

  Taiwan Semiconductor Manufacturing Company, Ltd.

  0 cites
• US121912622025

  Package Structure and Method for Fabricating the Same

  TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.

  0 cites
• US120400362024

  Magnetic Memory Device

  Taiwan Semiconductor Manufacturing Co., Ltd.

  0 cites
• US118373122023

  Magnetic Memory Device

  Taiwan Semiconductor Manufacturing Co., Ltd.

  0 cites
• US117554102023

  Systems and Methods for Correcting Data Errors in Memory

  Taiwan Semiconductor Manufacturing Company Limited

  0 cites
• US117496172023

  Package Structure and Method for Fabricating the Same

  TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.

  0 cites
• US117260622023

  Magnetic Layer Characterization System and Method

  Taiwan Semiconductor Manufacturing Company Ltd

  0 cites
• US117267472023

  Magnetoresistive Random-access Memory (MRAM) Random Number Generator (RNG) and a Related Method for Generating a Random Bit

  Taiwan Semiconductor Manufacturing Company, Ltd.

  0 cites
• US117197422023

  Semiconductor Wafer Testing System and Related Method for Improving External Magnetic Field Wafer Testing

  Taiwan Semiconductor Manufacturing Company, Ltd.

  0 cites