6 Patents
- US126017602026Probe Card Device and Tunnel-type Probe Thereof
CHUNGHWA PRECISION TEST TECH. CO., Ltd.
0 cites - US126017612026Vertical Probe Card and Open-type Probe Thereof
CHUNGHWA PRECISION TEST TECH. CO., Ltd.
0 cites - 0 cites
- US117473952023Board-like Connector, Single-arm Bridge of Board-like Connector, and Wafer Testing Assembly
CHUNGHWA PRECISION TEST TECH. CO., Ltd.
0 cites - US116998712023Board-like Connector, Dual-arm Bridge of Board-like Connector, and Wafer Testing Assembly
CHUNGHWA PRECISION TEST TECH. CO., Ltd.
0 cites - US115612442023Board-like Connector, Dual-ring Bridge of Board-like Connector, and Wafer Testing Assembly
CHUNGHWA PRECISION TEST TECH. CO., Ltd.
0 cites