3 Patents
- US119903682024Doped Selective Metal Caps to Improve Copper Electromigration with Ruthenium Liner
Applied Materials, Inc.
0 cites - US119232442024Subtractive Metals and Subtractive Metal Semiconductor Structures
Applied Materials, Inc.
0 cites - US118307252023Method of Cleaning a Structure and Method of Depositing a Capping Layer in a Structure
Applied Materials, Inc.
0 cites