Patents/Inventors

Mehdi Vaez-iravani

Los Gatos, CAUS12 patents

11 Patents

US125640152026
Integrated Inspection for Enhanced Hybrid Bonding Yield in Advanced Semiconductor Packaging Manufacturing
Applied Materials Inc.
0 cites
US125470832026
Use of Alternating Layer Patterns Approach for Effective Overlay Metrology in Multi-stack Die Applications
Applied Materials, Inc.
0 cites
US124552382025
Time Delay Integration Acquisition for Spatial Genomics Imaging
Applied Materials, Inc.
0 cites
US123946552025
Subsurface Alignment Metrology System for Packaging Applications
APPLIED MATERIALS, Inc.
0 cites
US122883502025
Image Based Metrology of Surface Deformations
Applied Materials, Inc.
0 cites
US122764902025
System and Method to Map Thickness Variations of Substrates in Manufacturing Systems
Applied Materials, Inc.
0 cites
US122226592025
Metrology System for Packaging Applications
APPLIED MATERIALS, Inc.
0 cites
US122117172025
Spatial Pattern Loading Measurement with Imaging Metrology
Applied Materials, Inc.
0 cites
US120989142024
Surface Roughness and Emissivity Determination
Applied Materials, Inc.
0 cites
US120026652024
Real-time Detection of Particulate Matter During Deposition Chamber Manufacturing
Applied Materials, Inc.
0 cites
US119087162024
Image-based In-situ Process Monitoring
Applied Materials, Inc.
0 cites