3 Patents
- US125466872026Immunostaining Method, Sample Exchange Chamber, and Charged Particle Beam Apparatus
Hitachi High-tech Corporation
0 cites - US120805112024Sample Holder, Method for Using Sample Holder, Projection Amount Adjustment Jig, Projection Amount Adjustment Method and Charged Particle Beam Device
Hitachi High-tech Corporation
0 cites - US117421782023Ion Milling Device and Milling Processing Method Using Same
Hitachi High-tech Corporation
0 cites