Patents/Inventors

Mayuka Osaki

TokyoJP2 patents

3 Patents

US125000612025
Observation System, Observation Method, and Program
Hitachi High-tech Corporation
0 cites
US121424572024
Charged Particle Beam Device
Hitachi High-tech Corporation
0 cites
US115453362023
Scanning Electron Microscopy System and Pattern Depth Measurement Method
HITACHI HIGH-TECH CORPORATION
0 cites