9 Patents
- US125861702026System and Method for Generating Predictive Images for Wafer Inspection Using Machine Learning
ASML Netherlands B.V.
0 cites - US125671642026Apparatus and Method for Determining Three Dimensional Data Based on an Image of a Patterned Substrate
ASML NETHERLANDS B.V.
0 cites - US124932472025Method and System for Predicting Process Information with a Parameterized Model
ASML Netherlands B.V.
0 cites - US123325732025Method for Determining Defectiveness of Pattern Based on After Development Image
ASML Netherlands B.V.
0 cites - US123211012025Method for Applying a Deposition Model in a Semiconductor Manufacturing Process
ASML NETHERLANDS B.V.
0 cites - 0 cites
- 0 cites
- US122042522025Method for Decision Making in a Semiconductor Manufacturing Process
ASML NETHERLANDS B.V.
0 cites - US116870072023Method for Decision Making in a Semiconductor Manufacturing Process
ASML NETHERLANDS B.V.
0 cites