Patents/Inventors

Maurice Peemen

Hillsboro, ORUS13 patents

11 Patents

US125538412026
Deep Learning Techniques for Fast Anomaly Detection in Experimental Data
FEI Company
0 cites
US125487322026
Application Management for Charged Particle Microscope Devices
FEI Company
0 cites
US125312042026
Microscope Aberration Correction
FEI Company
0 cites
US123927352025
Sparse Image Reconstruction from Neighboring Tomography Tilt Images
FEI Company
0 cites
US123470832025
Area Selection in Charged Particle Microscope Imaging
FEI Company
0 cites
US122886672025
Live-assisted Image Acquisition Method and System with Charged Particle Microscopy
FEI Company
0 cites
US121756482024
Method Implemented by a Data Processing Apparatus, and Charged Particle Beam Device for Inspecting a Specimen Using Such a Method
FEI Company
0 cites
US121365322024
Dual Speed Acquisition for Drift Corrected, Fast, Low Dose, Adaptive Compositional Charged Particle Imaging
FEI Company
0 cites
US118618172024
Method Implemented by a Data Processing Apparatus, and Charged Particle Beam Device for Inspecting a Specimen Using Such a Method
FEI Company
0 cites
US117417302023
Charged Particle Microscope Scan Masking for Three-dimensional Reconstruction
FEI Company
0 cites
US115690562023
Parameter Estimation for Metrology of Features in an Image
FEI Company
0 cites