7 Patents
- US126027562026Method and System for Analytical X-ray Calibration, Reconstruction and Indexing Using Simulation
Carl Zeiss X-ray Microscopy, Inc.
0 cites - US1248719420253D Particle Analysis and Separation Using Dual Seeding
CARL ZEISS X-RAY MICROSCOPY, Inc.
0 cites - 0 cites
- US121481382024Process Parameter Prediction Using Multivariant Structural Regression
Carl Zeiss X-ray Microscopy, Inc.
0 cites - 0 cites
- US118167652023System and Method for the Proscriptive Determination of Parameters for Iterative Reconstruction
Carl Zeiss X-ray Microscopy, Inc.
0 cites - US116457922023Edge Phase Effects Removal Using Wavelet Correction and Particle Classification Using Combined Absorption and Phase Contrast
Carl Zeiss X-ray Microscopy, Inc.
0 cites