3 Patents
- US125059762025Charged Particle Beam Apparatus and Method for Calculating Roughness Index
HITACHI HIGH-TECH CORPORATION
0 cites - US124630052025Correction Coefficient Calculation Device, Correction Coefficient Calculation Method, and Correction Coefficient Calculation Program
Hitachi High-tech Corporation
0 cites - US117911302023Electron Beam Observation Device, Electron Beam Observation System, and Image Correcting Method and Method for Calculating Correction Factor for Image Correction in Electron Beam Observation Device
Hitachi High-tech Corporation
0 cites