Patents/Inventors

Masayuki Ariyoshi

TokyoJP18 patents

17 Patents

US125106532025
Radar Apparatus, Imaging Method, and Non-transitory Computer-readable Medium
NEC CORPORATION
0 cites
US123860942025
Processing Apparatus, Estimation Apparatus, and Processing Method
NEC CORPORATION
0 cites
US123393592025
Target Object Detection Apparatus, Target Object Detection Method, and Non-transitory Computer Readable Medium
NEC CORPORATION
0 cites
US123393952025
Object Detection Apparatus, Object Detection Method, and Non-transitory Computer Readable Medium
NEC CORPORATION
0 cites
US122999852025
Peak Label Object Detection System and Method of Using
NEC CORPORATION
0 cites
US122594652025
Radar Apparatus, Imaging Method, and Non-transitory Storage Medium
NEC CORPORATION
0 cites
US122175082025
Processing Apparatus, Processing Method, and Non-transitory Storage Medium
NEC CORPORATION
0 cites
US120856662024
Radar Device, Imaging Method, and Imaging Program
NEC CORPORATION
0 cites
US120557172024
Inspection System and Inspection Method
NEC CORPORATION
0 cites
US119338852024
Radar Signal Imaging Device, Radar Signal Imaging Method, and Radar Signal Imaging Program
NEC CORPORATION
0 cites
US119140352024
Inspection System for Inspecting Contents of a Target Person, and Inspection Method Thereof
NEC CORPORATION
0 cites
US118601122024
Inspection System and Inspection Method
NEC CORPORATION
0 cites
US118154722023
Inspection System and Inspection Method
NEC CORPORATION
0 cites
US118155972023
Systems and Methods for Determining Contents of a Belongings Inspection Based on a Signal
NEC CORPORATION
0 cites
US117966762023
Apparatus and Method for Generating and Providing Detection Model, and Non-transitory Storage Medium
NEC CORPORATION
0 cites
US117333502023
Object Identification Apparatus, Object Identification Method, and Object Identification Program
NEC CORPORATION
0 cites
US116445562023
Position Measurement Device, Position Measurement Method, and Program Recording Medium
NEC CORPORATION
0 cites