Patents/Inventors

Masato Ohnishi

Nishigo-muraJP4 patents

3 Patents

US125971242026
Debris Determination Method
SHIN-ETSU HANDOTAI CO., Ltd.
0 cites
US121887612025
Method for Measuring Wafer Profile
SHIN-ETSU HANDOTAI CO., Ltd.
0 cites
US119281782024
Method for Creating Wafer Shape Data
SHIN-ETSU HANDOTAI CO., Ltd.
0 cites