Masato Hosaka

7 Patents

• US124063502025

  Estimation Model Creation Device, Estimation Model Creation Method, and Storage Medium

  Tokyo Electron Limited

  0 cites
• US121481472024

  Substrate Inspection Device, Substrate Inspection Method, and Storage Medium

  TOKYO ELECTRON LIMITED

  0 cites
• US120511892024

  Estimation Model Creation Device, Estimation Model Creation Method, and Storage Medium

  Tokyo Electron Limited

  0 cites
• US118239222023

  Substrate Inspection Apparatus, Substrate Processing Apparatus, Substrate Inspection Method, and Computer-readable Recording Medium

  TOKYO ELECTRON LIMITED

  0 cites
• US116365792023

  Information Processing Method, Information Processing Apparatus and Computer-readable Recording Medium

  TOKYO ELECTRON LIMITED

  0 cites
• US116095022023

  Substrate Inspection Apparatus, Substrate Processing Apparatus, Substrate Inspection Method, and Computer-readable Recording Medium

  TOKYO ELECTRON LIMITED

  0 cites
• US115448642023

  Shape Characteristic Value Estimation Apparatus, Shape Characteristic Value Estimation Method, and Storage Medium

  TOKYO ELECTRON LIMITED

  0 cites