Patents/Inventors

Masatake Takahashi

TokyoJP2 patents

2 Patents

US119466032024
Facility State Analyzing Device, Facility State Analyzing Method, and Recording Medium Storing Facility State Analyzing Program Thereon
NEC CORPORATION
0 cites
US115606982023
State Analysis Device, State Analysis Method, and Recording Medium
NEC CORPORATION
0 cites