53 Patents
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- US125385192026Semiconductor Device Having an Etching Stopper Layer on a First Insulation Layer
MAGNOLIA WHITE CORPORATION
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- US125139442025Semiconductor Device with an Oxide Semiconductor Having a Plurality of Openings
MAGNOLIA WHITE CORPORATION
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- US124084352025Semiconductor Device and Manufacturing Method Thereof
Semiconductor Energy Laboratory Co., Ltd.
0 cites - US123896312025Semiconductor Device and Manufacturing Method Thereof
Semiconductor Energy Laboratory Co., Ltd.
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- US123026392025Metal Oxide Film and Method for Forming Metal Oxide Film
Semiconductor Energy Laboratory Co., Ltd.
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- US122306962025Semiconductor Device and Method for Fabricating the Same
Semiconductor Energy Laboratory Co., Ltd.
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- US121989412025Display Device and Method for Manufacturing the Same
Semiconductor Energy Laboratory Co., Ltd.
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- US121913982025Semiconductor Device Comprising Lightly Doped Drain (LDD) Region Between Channel and Drain Region
Japan Display Inc.
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- US120984582024Metal Oxide Film, Semiconductor Device, and Display Device
Semiconductor Energy Laboratory Co., Ltd.
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- US120028182024Semiconductor Device and Manufacturing Method Thereof
Semiconductor Energy Laboratory Co., Ltd.
0 cites - US119787422024Metal Oxide Film and Method for Forming Metal Oxide Film
Semiconductor Energy Laboratory Co., Ltd.
0 cites - US119800482024Display Device Comprising First Area Including Pixel and Second Area Including Transparent Area
Japan Display Inc.
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- US119675052024Method for Manufacturing Sputtering Target, Method for Forming Oxide Film, and Transistor
Semiconductor Energy Laboratory Co., Ltd.
0 cites - US119359442024Semiconductor Device and Method for Fabricating the Same
Semiconductor Energy Laboratory Co., Ltd.
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- US119232062024Display Device and Method for Manufacturing the Same
Semiconductor Energy Laboratory Co., Ltd.
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- US118374612023Semiconductor Device and Manufacturing Method Thereof
Semiconductor Energy Laboratory Co., Ltd.
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- US116950192023Semiconductor Device and Manufacturing Method Thereof
Semiconductor Energy Laboratory Co., Ltd.
0 cites - US116521102023Metal Oxide Film and Method for Forming Metal Oxide Film
Semiconductor Energy Laboratory Co., Ltd.
0 cites - 0 cites
- US116370152023Method for Manufacturing Sputtering Target, Method for Forming Oxide Film, and Transistor
Semiconductor Energy Laboratory Co., Ltd.
0 cites - US116007052023Semiconductor Device and Method for Measuring Current of Semiconductor Device
SEMICONDUCTOR ENERGY LABORATORY CO., Ltd.
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