Masashi Kurita

5 Patents

• US122174112025

  Inspection Apparatus, Unit Selection Apparatus, Inspection Method, and Computer-readable Storage Medium Storing an Inspection Program

  OMRON CORPORATION

  0 cites
• US118301742023

  Defect Inspecting Device, Defect Inspecting Method, and Storage Medium

  OMRON Corporation

  0 cites
• US117692482023

  Image Processing Device, Image Processing Method, and Image Processing Non-transitory Computer Readable Medium for Verifying Detectable Range of Defect Image

  OMRON Corporation

  0 cites
• US116312302023

  Method, Device, System and Computer-program Product for Setting Lighting Condition and Storage Medium

  OMRON Corporation

  0 cites
• US115743972023

  Image Processing Device, Image Processing Method, and Computer Readable Recording Medium

  OMRON Corporation

  0 cites