Patents/Inventors

Masanori Sekido

TokyoJP3 patents

4 Patents

US120557172024
Inspection System and Inspection Method
NEC CORPORATION
0 cites
US119140352024
Inspection System for Inspecting Contents of a Target Person, and Inspection Method Thereof
NEC CORPORATION
0 cites
US118601122024
Inspection System and Inspection Method
NEC CORPORATION
0 cites
US118154722023
Inspection System and Inspection Method
NEC CORPORATION
0 cites