Patents/Inventors

Masami Makuuchi

TokyoJP2 patents

3 Patents

US124223772025
Defect Inspection Apparatus and Defect Inspection Method
Hitachi High-tech Corporation
0 cites
US122766182025
Defect Inspection Device
Hitachi High-tech Corporation
0 cites
US120446272024
Defect Inspection Device and Defect Inspection Method
Hitachi High-tech Corporation
0 cites