7 Patents
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- US125042732025Measuring Film-thickness of a Workpiece in a Semiconductor Processing Apparatus Using a Composite Spectrum
EBARA CORPORATION
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- US116732242023Light Transmitting Member, Polishing Pad, and Substrate Polishing Apparatus
EBARA CORPORATION
0 cites - US116427532023Polishing-pad Laminated Structure, Polishing-pad Positioning Instrument, and Method of Attaching a Polishing Pad to a Polishing Table
EBARA CORPORATION
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