Patents/Inventors

Martinus Gerardus Maria Johannes Maassen

San Francisco, CAUS1 patent

2 Patents

US121658372024
System and Method for Scanning a Sample Using Multi-beam Inspection Apparatus
ASML Netherlands B.V.
0 cites
US117987772023
Charged Particle Beam Apparatus, and Systems and Methods for Operating the Apparatus
ASML Netherlands B.V.
0 cites