3 Patents
- US118933362024Utilizing Transition ATPG Test Patterns to Detect Multicycle Faults And/or Defects in an IC Chip
Cadence Design Systems, Inc.
0 cites - US117402842023Diagnosing Multicycle Faults And/or Defects with Single Cycle ATPG Test Patterns
Cadence Design Systems, Inc.
0 cites - US115791942023Utilizing Single Cycle ATPG Test Patterns to Detect Multicycle Cell-aware Defects
CADENCE DESIGN SYSTEMS, Inc.
0 cites