Patents/Inventors

Martin M. Liphardt

Lincoln, NEUS6 patents

7 Patents

US124983172025
Sample Alignment System in Reflectometers, Ellipsometers, Spectrophotometers and the Like
J.A. WOOLLAM CO., Inc.
0 cites
US124052102025
System For, and Calibration and Testing of Directed Beam Ellipsometer Systems
J.A. WOOLLAM CO., Inc.
0 cites
US123321632025
System For, and Calibration and Testing of Directed Beam Ellipsometer Systems
J.A. WOOLLAM CO., Inc.
0 cites
US118857382024
Reflectometer, Spectrophotometer, Ellipsometer or Polarimeter System Including Sample Imaging System That Simultaneously Meet the Scheimpflug Condition and Overcomes Keystone Error
J.A. WOOLLAM CO., Inc.
0 cites
US118218332023
Fast and Accurate Mueller Matrix Infrared Ellipsometer
J.A. WOOLLAM CO., Inc.
0 cites
US117401762023
Fast and Accurate Mueller Matrix Infrared Spectroscopic Ellipsometer
J.A. WOOLLAM CO., Inc
0 cites
US116752082023
Reflectometer, Spectrophotometer, Ellipsometer and Polarimeter System with a Super Continuum Laser Source of a Beam of Electromagnetism, and Improved Detector System
J.A. WOOLLAM CO., Inc.
0 cites