Martin Jacobus Johan Jak

3 Patents

• US124293282025

  Metrology Method, Target and Substrate

  ASML NETHERLANDS B.V.

  0 cites
• US116500472023

  Metrology Apparatus and Method for Determining a Characteristic of One or More Structures on a Substrate

  ASML Netherlands B.V.

  0 cites
• US115496512023

  Eye-safe Laser-based Lighting

  Signify Holding B.V.

  0 cites