Markus Gerardus Martinus Maria Van Kraaij

7 Patents

• US126191582026

  Metrology Target Simulation

  ASML Netherlands B.V.

  0 cites
• US124932472025

  Method and System for Predicting Process Information with a Parameterized Model

  ASML Netherlands B.V.

  0 cites
• US123264072025

  Inspection Apparatus and Inspection Method

  ASML NETHERLANDS B.V.

  0 cites
• US122711142025

  Method and Apparatus for Predicting Substrate Image

  ASML NETHERLANDS B.V.

  0 cites
• US119829462024

  Metrology Targets

  ASML HOLDING N.V.

  0 cites
• US117200292023

  Method and Apparatus for Image Analysis

  ASML NETHERLANDS B.V.

  0 cites
• US116929482023

  Inspection Apparatus and Inspection Method

  ASML NETHERLANDS B.V.

  0 cites