4 Patents
- US120663912024Method and System for Non-destructive Metrology of Thin Layers
NOVA MEASURING INSTRUMENTS, Inc.
0 cites - US119064512024Method and System for Non-destructive Metrology of Thin Layers
GLOBALFOUNDRIES U.S. Inc.
0 cites - US117330352023Feed-forward of Multi-layer and Multi-process Information Using XPS and XRF Technologies
NOVA MEASURING INSTRUMENTS Inc.
0 cites - US116686632023Method and System for Non-destructive Metrology of Thin Layers
NOVA MEASURING INSTRUMENTS, Inc.
0 cites