Patents/Inventors

Mark John Maslow

EindhovenNL8 patents

7 Patents

US125861702026
System and Method for Generating Predictive Images for Wafer Inspection Using Machine Learning
ASML Netherlands B.V.
0 cites
US123325732025
Method for Determining Defectiveness of Pattern Based on After Development Image
ASML Netherlands B.V.
0 cites
US121971362025
Method of Determining Control Parameters of a Device Manufacturing Process
ASML NETHERLANDS B.V.
0 cites
US118605482024
Method for Characterizing a Manufacturing Process of Semiconductor Devices
ASML NETHERLANDS B.V.
0 cites
US118475702023
Deep Learning for Semantic Segmentation of Pattern
ASML NETHERLANDS B.V.
0 cites
US117684422023
Method of Determining Control Parameters of a Device Manufacturing Process
ASML NETHERLANDS B.V.
0 cites
US117336102023
Method and System to Monitor a Process Apparatus
ASML NETHERLANDS B.V.
0 cites