Patents/Inventors

Mark D. Dimanna

Fremont, NHUS1 patent

2 Patents

US122707742025
System to Inspect, Modify or Analyze a Region of Interest of a Sample by Charged Particles, Set of Systems to Inspect, Modify or Analyze a Region of Interest of a Sample and Method to Inspect, Modify or Analyze a Region of Interest of a Sample by Charged Particles
Carl Zeiss SMT GmbH
0 cites
US120446382024
System to Inspect, Modify or Analyze a Region of Interest of a Sample by Charged Particles, Set of Systems to Inspect, Modify or Analyze a Region of Interest of a Sample and Method to Inspect, Modify or Analyze a Region of Interest of a Sample by Charged Particles
Carl Zeiss SMT GmbH
0 cites