Marie-claire Van Lare

6 Patents

• US126191602026

  Systems and Methods for Reducing Pattern Shift in a Lithographic Apparatus

  ASML NETHERLANDS B.V.

  0 cites
• US125861702026

  System and Method for Generating Predictive Images for Wafer Inspection Using Machine Learning

  ASML Netherlands B.V.

  0 cites
• US123862682025

  Method for Calibrating Simulation Process Based on Defect-based Process Window

  ASML NETHERLANDS B.V.

  0 cites
• US123211012025

  Method for Applying a Deposition Model in a Semiconductor Manufacturing Process

  ASML NETHERLANDS B.V.

  0 cites
• US121971202025

  Patterning Device and Method of Use Thereof

  ASML NETHERLANDS B.V.

  0 cites
• US118927762024

  Imaging via Zeroth Order Suppression

  ASML NETHERLANDS B.V.

  0 cites