7 Patents
- US124678772025Methods for Detecting Defects in a Single Crystal Silicon Structure
Globalwafers Co., Ltd.
0 cites - US123984832025Ingot Puller Apparatus Having a Flange That Extends from the Funnel or from the Silicon Feed Tube
Globalwafers Co., Ltd.
0 cites - US120376982024Ingot Puller Apparatus Having a Flange That Extends from the Funnel or from the Silicon Feed Tube
GLOBALWAFERS CO., Ltd
0 cites - US119878992024Methods for Preparing an Ingot in an Ingot Puller Apparatus and Methods for Selecting a Side Heater Length for Such Apparatus
Globalwafers Co., Ltd.
0 cites - US119879002024Methods for Forming a Silicon Substrate with Reduced Grown-in Nuclei for Epitaxial Defects and Methods for Forming an Epitaxial Wafer
Globalwafers Co., Ltd.
0 cites - US119879012024Methods for Forming a Silicon Substrate with Reduced Grown-in Nuclei for Epitaxial Defects and Methods for Forming an Epitaxial Wafer
Globalwafers Co., Ltd.
0 cites - US118668452024Methods for Growing Single Crystal Silicon Ingots That Involve Silicon Feed Tube Inert Gas Control
Globalwafers Co., Ltd.
0 cites