Patents/Inventors

Marco Jan-jaco Wieland

DelftNL16 patents

15 Patents

US125487352026
Charged Particle Assessment Tool, Inspection Method
ASML NETHERLANDS B.V.
0 cites
US125371582026
Charged Particle Assessment Tool, Inspection Method
ASML Netherlands B.V.
0 cites
US125059782025
Charged Particle Assessment Tool, Inspection Method
ASML Netherlands B.V.
0 cites
US124760692025
Charged Particle Assessment Tool, Inspection Method
ASML NETHERLANDS B.V.
0 cites
US124223872025
Charged Particle Optical Device, Objective Lens Assembly, Detector, Detector Array, and Methods
ASML Netherlands B.V.
0 cites
US123879032025
Aberration Correction in Charged Particle System
ASML Netherlands B.V.
0 cites
US123810622025
Tool for Testing an Electron-optical Assembly
ASML Netherlands B.V.
0 cites
US121256712024
Multi-source Charged Particle Illumination Apparatus
ASML NETHERLANDS B.V.
0 cites
US119842952024
Charged Particle Assessment Tool, Inspection Method
ASML NETHERLANDS B.V.
0 cites
US119616272024
Vacuum Chamber Arrangement for Charged Particle Beam Generator
ASML Netherlands B.V.
0 cites
US118218592023
Charged Particle Optical Device, Objective Lens Assembly, Detector, Detector Array, and Methods
ASML Netherlands B.V.
0 cites
USRE0497252023
Method and Arrangement for Handling and Processing Substrates
ASML Netherlands B.V.
0 cites
US117987832023
Charged Particle Assessment Tool, Inspection Method
ASML NETHERLANDS B.V.
0 cites
USRE0496022023
Lithography System, Sensor and Measuring Method
ASML Netherlands B.V.
0 cites
US117052522023
Vacuum Chamber Arrangement for Charged Particle Beam Generator
ASML Netherlands B.V.
0 cites