Malcolm J. Bevan

7 Patents

• US125753572026

  Integrated Wet Clean for Gate Stack Development

  Applied Materials, Inc.

  0 cites
• US124871212025

  Methods for Calibrating an Optical Emission Spectrometer

  Applied Materials, Inc.

  0 cites
• US122665602025

  Film Thickness Uniformity Improvement Using Edge Ring and Bias Electrode Geometry

  Applied Materials, Inc.

  0 cites
• USD10344912024

  Edge Ring

  Applied Materials, Inc.

  0 cites
• US119274822024

  Methods for Calibrating an Optical Emission Spectrometer

  Applied Materials, Inc.

  0 cites
• US119234412024

  Gate All Around I/O Engineering

  Applied Materials, Inc.

  0 cites
• US115814082023

  Method and Apparatus for Selective Nitridation Process

  Applied Materials, Inc.

  0 cites