Patents/Inventors

Maikel Robert Goosen

EindhovenNL6 patents

7 Patents

US122304692025
Apparatus for and Method of Local Control of a Charged Particle Beam
ASML Netherlands B.V.
0 cites
US121835402024
Systems and Methods of Determining Aberrations in Images Obtained by a Charged-particle Beam Tool
ASML Netherlands B.V.
0 cites
US121658362024
Systems and Methods of Profiling Charged-particle Beams
ASML Netherlands B.V.
0 cites
US119617002024
Systems and Methods for Image Enhancement for a Multi-beam Charged-particle Inspection System
ASML Netherlands B.V.
0 cites
US119423022024
Pulsed Charged-particle Beam System
ASML Netherlands B.V.
0 cites
US118813742024
Apparatus for and Method of Controlling an Energy Spread of a Charged-particle Beam
ASML Netherlands B.V.
0 cites
US117911322023
Aperture Array with Integrated Current Measurement
ASML Netherlands B.V.
0 cites