3 Patents
- US122706022025Method of Preparing a Cryogenic Sample with Improved Cooling Characteristic
FEI Company
0 cites - US119943412024Method of Preparing a Cryogenic Sample with Improved Cooling Characteristic
FEI Company
0 cites - US115877622023Device and Method for Determining a Property of a Sample That Is to Be Used in a Charged Particle Microscope
FEI Company
0 cites