Maarten Jozef Jansen

7 Patents

• US124812262025

  Interferometer System, Positioning System, a Lithographic Apparatus, a Jitter Determination Method, and a Device Manufacturing Method

  ASML NETHERLANDS B.V.

  0 cites
• US123059792025

  Interferometer System and Lithographic Apparatus

  ASML NETHERLANDS B.V.

  0 cites
• US123065482025

  Positioning System, a Lithographic Apparatus, an Absolute Position Determination Method, and a Device Manufacturing Method

  ASML NETHERLANDS B.V.

  0 cites
• US122706442025

  Compact Dual Pass Interferometer for a Plane Mirror Interferometer

  ASML NETHERLANDS B.V.

  0 cites
• US122706472025

  Method for Calibration of an Optical Measurement System and Optical Measurement System

  ASML NETHERLANDS B.V.

  0 cites
• US117195292023

  Interferometer System, Method of Determining a Mode Hop of a Laser Source of an Interferometer System, Method of Determining a Position of a Movable Object, and Lithographic Apparatus

  ASML NETHERLANDS B.V.

  0 cites
• US115560662023

  Stage System and Lithographic Apparatus

  ASML Netherlands B.V.

  0 cites