Patents/Inventors

Maarten Bischoff

UdenNL5 patents

5 Patents

US125487312026
Systems and Methods for Transferring a Sample
FEI Company
0 cites
US124630092025
Method and System for Studying Samples Using a Scanning Transmission Charged Particle Microscope with Reduced Beam Induced Sample Damage
FEI Company
0 cites
US121761792024
Method, Device and System for Reducing Off-axial Aberration in Electron Microscopy
FEI Company
0 cites
US118172902023
Method, Device and System for Reducing Off-axial Aberration in Electron Microscopy
FEI Company
0 cites
US115877592023
Method, Device and System for Reducing Off-axial Aberration in Electron Microscopy
FEI Company
0 cites