Lydia Marianna Vergaij-huizer

4 Patents

• US125911772026

  Method for Obtaining Training Data for Training a Model of a Semiconductor Manufacturing Process

  ASML NETHERLANDS B.V.

  0 cites
• US117823492023

  Methods of Determining Corrections for a Patterning Process, Device Manufacturing Method, Control System for a Lithographic Apparatus and Lithographic Apparatus

  ASML NETHERLANDS B.V.

  0 cites
• US116690172023

  Method for Controlling a Manufacturing Apparatus and Associated Apparatuses

  ASML NETHERLANDS B.V.

  0 cites
• US115927532023

  Methods of Determining Corrections for a Patterning Process, Device Manufacturing Method, Control System for a Lithographic Apparatus and Lithographic Apparatus

  ASML Netherlands B.V.

  0 cites