5 Patents
- US123528022025Circuits and Techniques for Predicting End of Life Based on in Situ Monitors and Limit Values Defined for the in Situ Monitors
Infineon Technologies AG
0 cites - US122542542025Circuits and Techniques for Predicting Failure of Circuits Based on Stress Origination Metrics and Stress Victim Events
Infineon Technologies AG
0 cites - US118219352023Differential Aging Monitor Circuits and Techniques for Assessing Aging Effects in Semiconductor Circuits
Infineon Technologies AG
0 cites - US117332882023Circuits and Techniques for Assessing Aging Effects in Semiconductor Circuits
Infineon Technologies AG
0 cites - US116092652023End-of-life Prediction for Circuits Using Accelerated Reliability Models and Sensor Data
Infineon Technologies AG
0 cites