Ludovic Lay

3 Patents

• US117899312023

  User-interactive Defect Analysis for Root Cause

  Palantir Technologies Inc.

  0 cites
• US117554542023

  Defect Resolution

  Palantir Technologies Inc.

  0 cites
• US116452502023

  Detection and Enrichment of Missing Data or Metadata for Large Data Sets

  Palantir Technologies Inc.

  0 cites